NIKON METROLOGY XTV 160 NF, Nano Focus X-Ray Inspection

NIKON METROLOGY XTV 160 NF, Nano Focus X-Ray Inspection View Large Image
XTV 160 NF

XT V 160 NF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications. Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today. As such, the XT V 160 NF is indispensable for any electronics development and production environment.

Key benefits <0.1 μm feature recognition up to 6 W power High precision manipulator with vibration reduction 3 Mpixel flat panel for ultra high definition Large tray to load multiple components and boards as well as 450 mm wafer ready Productivity increase by automation and instant reporting

Oops! Something went wrong there and we were unable to load the page you requested.

Sign Up